布伦德尔、埃文斯、霍罗威主编的这本《金属与合金的表征》是材料表征原版系列丛书之一。全书共分10章，内容包括：界面分析和力学性能，化学性质，矿物加工和金属回收，熔炼和铸造，金属加工，涂层和薄膜，故障分析等。本书适合作为相关领域的教学、研究、技术人员以及研究生和高年级本科生的参考书。

Preface to the Reissue of the Materials Characterization Series

Preface to Series

Preface to the Reissue of Characterization of Metals andAlloys

Preface

Acronyms Glossary

Contributors

INTRODUCTION

 1.1 Purpose and Organization of the Book

MECHANICAL PROPERTIES AND INTERFACIAL ANALYSIS

 2.1 Introduction

 2.2 Grain Boundary Segregation

 2.3 Temper Embrittlement

 2.4 Corrosion and Stress Corrosion Cracking

 2.5 Hydrogen Embrittlement

 2.6 Creep Embrittlement

 2.7 Future Directions

CHEMICAL PROPERTIES

 3.1 Introduction

 3.2 Tools of the Trade--Unique Information Available

 3.3 Gaseous Corrosion

 3.4 Aqueous Corrosion

 3.5 Surface Electronic Structure and Chemistry

 3.6 Surface Modification

 3.7 Summary

SURFACE AND THIN FILM ANALYSIS OF DIFFUSION IN METALS

 4.1 Introduction

 4.2 The Mathematics of Diffusion

 4.3 Effects of Non-Uniform Cross Sections

 4.4 Effects of Finite Thickness

 4.5 Analysis Techniques for Diffusion

 4.6 Case Studies of Diffusion

 4.7 Summary

MINERAL PROCESSING AND METAL RECLAMATION

 5.1 Introduction

 5.2 Techniques for Mineral Surface Characterization

 5.3 Surface Bonding in Mineral-Fluid Systems

 5.4 Complementary Composition Analyses of Rough and Polished Surfaces

 5.5 Summary

MELTING AND CASTING

 6.1 Introduction

 6.2 Aluminum-Lithium Alloys

 6.3 Aluminum-Magnesium Alloys

 6.4 Rapidly Solidified Aluminum Alloy Powders

 6.5 Cast Aluminum Alloy Metal Matrix Composites

 6.6 Liquid Aluminum Alloys

 6.7 Summary

MACHINING AND WORKING OF METALS

 7.1 Introduction

 7.2 Physical and Chemical Characterization

 7.3 Lubrication

 7.4 Surface Finish

 7.5 Metalworking Example

 7.6 Summary

CHARACTERIZATION OF THE CLEANING OF SURFACES OF METALS AND METAL ALLOYS

 8.1 Introduction

 8.2 Characterization of Cleaning Procedures

 8.3 Specimen Handling and Interpretation of Data

 8.4 Summary

COATINGS AND THIN FILMS

 9.1 Introduction

 9.2 Techniques for Creating Coatings and Thin Films

 9.3 Techniques to Characterize Coatings and Thin Films

 9.4 Studies of Coatings on Metals

 9.5 Studies of Thin Films on Metals

 9.6 Summary

FAILURE ANALYSIS

 10.1 Introduction

 10.2 Collaboration with the Applications Engineering Team

 10.3 Failure Analysis Case Histories

 10.4 Summary

APPENDIX: TECHNIQUE SUMMARIES

 1 Auger Electron Spectroscopy (AES)

 2 Cathodoluminescence (CL)

 3 Dynamic Secondary Ion Mass Spectrometry (Dynamic SIMS)

 4 Elastic Recoil Spectrometry (ERS)

 5 Electron Energy-Loss Spectroscopy in the Transmission Electron Microscope (EELS)

 6 Electron Probe X-Ray Microanalysis (EPMA)

 7 Energy-Dispersive X-Ray Spectroscopy (EDS)

 8 Extended X-Ray Absorption Fine Structure (EXAFS)

 9 Field Ion Microscopy (FIM)

 10 Fourier Transform Infrared Spectroscopy (FTIR)

 11 Glow-Discharge Mass Spectrometry (GDMS)

 12 High-Resolution Electron Energy Loss Spectroscopy (HREELS)

 13 Inductively Coupled Plasma Mass Spectrometry (ICPMS)

 14 Inductively Coupled Plasma-Optical Emission Spectroscopy(ICP-OES)

 15 Ion Scattering Spectroscopy (ISS)

 16 Laser Ionization Mass Spectrometry (LIMS)

 17 Low-Energy Electron Diffraction (LEED)

 18 Low-Energy Electron Microscopy (LEEM)

 19 Magneto-Optic Kerr Effect (MOKE)

 20 Medium-Energy Ion Scattering with Channeling and Blocking (MEIS)

 21 Neutron Activation Analysis (NAA)

 22 Nuclear Reaction Analysis (NRA)

 23 Optical Micro-Reflectometry (OMR) and Differential Reflectometry (DR)

 24 Optical Second Harmonic Generation (SHG)

 25 Particle-Induced X-Ray Emission (PIXE)

 26 Photoacoustic Spectroscopy (PAS)

 27 Photoelectron Emission Microscopy (PEEM)

 28 Photoluminescence (PL)

 29 Reflected Electron Energy-Loss Spectroscopy (REELS)

 30 Reflection High-Energy Electron Diffraction (RHEED)

 31 Rutherford Backscattering Spectrometry (RBS)

 32 Scanning Electron Microscopy (SEM)

 33 Scanning Transmission Electron Microscopy (STEM)

 34 Scanning Tunneling Microscopy and Scanning Force Microscopy(STM and SFM)

 35 Solid State Nuclear Magnetic Resonance (NMR)

 36 Spark Source Mass Spectrometry (SSMS)

 37 Sputtered Neutral Mass Spectrometry (SNMS)

 38 Static Secondary Ion Mass Spectrometry (Static SIMS)

 39 Surface Analysis by Laser Ionization (SALI)

 40 Surface Extended X-Ray Absorption Fine Structure and Near Edge X-Ray Absorption Fine Structure (SEXAFS/NEXAFS)

 41 Temperature Programmed Desorption (TPD)

 42 Total Reflection X-Ray Fluorescence Analysis (TXRF)

 43 Transmission Electron Microscopy (TEM)

 44 Ultraviolet Photoelectron Spectroscopy (UPS)

 45 Variable-Angle Spectroscopic Ellipsometry (VASE)

 46 X-Ray Diffraction (XRD)

 47 X-Ray Fluorescence (XRF)

 48 X-Ray Photoelectron and Auger Electron Diffraction (XPD and AED)

 49 X-Ray Photoelectron Spectroscopy (XPS)

Index